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Semiconductor Material and Device Characterization
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Jump down to see edition details for Semiconductor Material and Device Characterization: Hardcover | Miscellaneous | Miscellaneous
Jump down to see edition details for Horngren's Financial & Managerial Accounting + Myaccountinglab With Pearson Etext Access Card: The Managerial Chapters: Hardcover | Paperback
Jump down to see edition details for Horngren's Financial & Managerial Accounting + Myaccountinglab With Pearson Etext Access Card: The Managerial Chapters: Hardcover | Paperback
Bibliographic Detail
Publisher
John Wiley & Sons Inc
Publication date
June 1, 1990
Binding
Hardcover
Book category
Adult Non-Fiction
ISBN-13
9780471511045
ISBN-10
0471511048
Dimensions
1.25 by 6.50 by 9.75 in.
Weight
2.15 lbs.
Availability§
Out of Print
Original list price
$99.95
Other format details
sci/tech
§As reported by publisher
Amazon.com says people who bought this book also bought:
Fabrication Engineering at the Micro- and Nanoscale | Semiconductor Device Fundamentals | Electric Energy | Physics of Semiconductor Devices | CMOS | Reliability and Failure of Electronic Materials and Devices | Introduction To Solid State Physics | Silicon Processing for the Vlsi Era | The Oxford Solid State Basics
Fabrication Engineering at the Micro- and Nanoscale | Semiconductor Device Fundamentals | Electric Energy | Physics of Semiconductor Devices | CMOS | Reliability and Failure of Electronic Materials and Devices | Introduction To Solid State Physics | Silicon Processing for the Vlsi Era | The Oxford Solid State Basics
Summaries and Reviews
Editions
Editions for the work Semiconductor Material and Device Characterization
Hardcover
3 edition from IEEE (January 30, 2006)
9780471739067 | details & prices | 779 pages | 6.25 × 9.25 × 1.50 in. | 2.11 lbs | List price $204.00
2 sub edition from Wiley-Interscience (May 1, 1998)
9780471241393 | details & prices | 760 pages | 6.50 × 9.75 × 1.75 in. | 2.75 lbs | List price $132.00
About: Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices.
About: Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices.
The price comparison is for this edition
With Ella Mae Matsumura, Brenda L. Mattison, Tracie L. Miller-nobles |
from John Wiley & Sons Inc (June 1, 1990)
9780471511045 | details & prices | 6.50 × 9.75 × 1.25 in. | 2.15 lbs | List price $99.95
This edition also contains Horngren's Financial & Managerial Accounting + Myaccountinglab With Pearson Etext Access Card: The Managerial Chapters
This edition also contains Horngren's Financial & Managerial Accounting + Myaccountinglab With Pearson Etext Access Card: The Managerial Chapters
Miscellaneous
3 edition from Wiley-Interscience (February 10, 2006)
9780471749080 | details & prices | 784 pages | List price $160.00
Miscellaneous
3 onl edition from John Wiley & Sons Inc (February 6, 2006)
9780471749097 | details & prices | 784 pages | List price $145.95
Editions for the work Horngren's Financial & Managerial Accounting + Myaccountinglab With Pearson Etext Access Card: The Managerial Chapters
Hardcover
The price comparison is for this edition
With Dieter K. Schroder, Brenda L. Mattison, Tracie L. Miller-nobles |
from John Wiley & Sons Inc (June 1, 1990); titled "Semiconductor Material and Device Characterization"
9780471511045 | details & prices | 6.50 × 9.75 × 1.25 in. | 2.15 lbs | List price $99.95
This edition also contains Semiconductor Material and Device Characterization
This edition also contains Semiconductor Material and Device Characterization
Paperback
With Brenda L. Mattison, Tracie L. Miller-nobles |
5 pck pap/ edition from Prentice Hall (May 10, 2015)
9780134047478 | details & prices | 912 pages | 9.00 × 11.00 × 1.25 in. | 4.45 lbs | List price $240.47
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