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Semiconductor Material and Device Characterization
Descriptions of each edition are found in brief where available. Click details & prices to get more information on a book or to find the best prices for the title.
Hardcover
3 edition from IEEE (January 30, 2006)
9780471739067 | details & prices | 779 pages | 6.25 × 9.25 × 1.50 in. | 2.11 lbs | List price $204.00
2 sub edition from Wiley-Interscience (May 1, 1998)
9780471241393 | details & prices | 760 pages | 6.50 × 9.75 × 1.75 in. | 2.75 lbs | List price $132.00
About: Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices.
About: Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices.
With Ella Mae Matsumura, Brenda L. Mattison, Tracie L. Miller-nobles |
from John Wiley & Sons Inc (June 1, 1990)
9780471511045 | details & prices | 6.50 × 9.75 × 1.25 in. | 2.15 lbs | List price $99.95
This edition also contains Horngren's Financial & Managerial Accounting + Myaccountinglab With Pearson Etext Access Card: The Managerial Chapters
This edition also contains Horngren's Financial & Managerial Accounting + Myaccountinglab With Pearson Etext Access Card: The Managerial Chapters
Miscellaneous
3 edition from Wiley-Interscience (February 10, 2006)
9780471749080 | details & prices | 784 pages | List price $160.00
Miscellaneous
3 onl edition from John Wiley & Sons Inc (February 6, 2006)
9780471749097 | details & prices | 784 pages | List price $145.95