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Semiconductor Material and Device Characterization
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Bibliographic Detail
Publisher
John Wiley & Sons Inc
Publication date
February 6, 2006
Pages
784
Edition
3 onl
Book category
Adult Non-Fiction
ISBN-13
9780471749097
ISBN-10
0471749095
Availability§
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Original list price
$145.95
Other format details
sci/tech
§As reported by publisher
Summaries and Reviews
Editions
Hardcover
3 edition from IEEE (January 30, 2006)
9780471739067 | details & prices | 779 pages | 6.25 × 9.25 × 1.50 in. | 2.11 lbs | List price $204.00
2 sub edition from Wiley-Interscience (May 1, 1998)
9780471241393 | details & prices | 760 pages | 6.50 × 9.75 × 1.75 in. | 2.75 lbs | List price $132.00
About: Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices.
About: Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices.
With Ella Mae Matsumura, Brenda L. Mattison, Tracie L. Miller-nobles |
from John Wiley & Sons Inc (June 1, 1990)
9780471511045 | details & prices | 6.50 × 9.75 × 1.25 in. | 2.15 lbs | List price $99.95
This edition also contains Horngren's Financial & Managerial Accounting + Myaccountinglab With Pearson Etext Access Card: The Managerial Chapters
This edition also contains Horngren's Financial & Managerial Accounting + Myaccountinglab With Pearson Etext Access Card: The Managerial Chapters
Miscellaneous
3 edition from Wiley-Interscience (February 10, 2006)
9780471749080 | details & prices | 784 pages | List price $160.00
Miscellaneous
The price comparison is for this edition
3 onl edition from John Wiley & Sons Inc (February 6, 2006)
9780471749097 | details & prices | 784 pages | List price $145.95
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