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The Role of Microscopy in Semiconductor Failure Analysis
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Product Description: Microscopy is central to the vast majority of semiconductor failure analyses, and is therefore of great importance to engineers concerned with design validation, process optimization, component qualification, testing, and pre- or post-use diagnostics...read more
By P. K. Footner and B. P. Richards
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Paperback:

9780198564324 | Gordon & Breach Science Pub, August 1, 1992, cover price $29.95 | About this edition: Microscopy is central to the vast majority of semiconductor failure analyses, and is therefore of great importance to engineers concerned with design validation, process optimization, component qualification, testing, and pre- or post-use diagnostics.

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