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The Role of Microscopy in Semiconductor Failure Analysis
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Paperback
from Gordon & Breach Science Pub (August 1, 1992)
9780198564324 | details & prices | List price $29.95
About: Microscopy is central to the vast majority of semiconductor failure analyses, and is therefore of great importance to engineers concerned with design validation, process optimization, component qualification, testing, and pre- or post-use diagnostics.
About: Microscopy is central to the vast majority of semiconductor failure analyses, and is therefore of great importance to engineers concerned with design validation, process optimization, component qualification, testing, and pre- or post-use diagnostics.