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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy
By
Wai Kin Chim
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Jump down to see edition details for: Hardcover
Bibliographic Detail
Publisher
John Wiley & Sons Inc
Publication date
January 9, 2001
Pages
269
Binding
Hardcover
Book category
Adult Non-Fiction
ISBN-13
9780471492405
ISBN-10
047149240X
Dimensions
1 by 6.25 by 9.25 in.
Weight
1.15 lbs.
Published in
Great Britain
Original list price
$277.00
Other format details
sci/tech
Summaries and Reviews
(view table of contents)
Editions
Hardcover
The price comparison is for this edition
from John Wiley & Sons Inc (January 9, 2001)
9780471492405 | details & prices | 269 pages | 6.25 × 9.25 × 1.00 in. | 1.15 lbs | List price $277.00
About: Fault detection has become increasingly difficult as integrated circuits become more and more complex.
About: Fault detection has become increasingly difficult as integrated circuits become more and more complex.
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