Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Product Description: This important new reference book on human cancer provides a global picture of the epidemiology of cancer and its environmental causes. By summarising on a cancer-by-cancer basis geographical, environmental and ethical factors, the volume collates a wealth of information which, taken together, provides valuable insights into the causes of cancer and scope for its elimination and control...read more

Product Description: Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis...read more

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Product Description: Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer...read more

Product Description: Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more...read more

Product Description: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials...read more

Product Description: In a clear exposition this inspirational book shows the in situ three-dimensional morphology of cerebellar neurons, intracortical circuits and synaptic connections that underpin the functioning of cerebellar neurons in networks. It brings together in one volume a new view of the three-dimensional cytoarchitectonic arrangement of the cerebellar cortex...read more

Product Description: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described...read more (view table of contents, read Amazon.com's description)

(view table of contents)

Product Description: Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or electron channeling for local crystallographic information...read more (view table of contents, read Amazon.com's description)

Product Description: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information...read more

Product Description: Backscattered scanning electron microscopy (BSE) reveals the minerals, textures, and fabrics of sediments and rocks in much greater detail than is possible with conventional optical microscopy. Backscattered Scanning Electron Microscopy provides a concise summary of the BSE technique...read more (view table of contents, read Amazon.com's description)

Using scanning electron microscopy, studies household dirt, dust, and germs, and the substances that are used to get rid of them

Product Description: -- The Review of Arts Literature, Philsophy and the Humanities (view table of contents, read Amazon.com's description)

(view table of contents)

Product Description: Materials Engineering has evolved as a crucial engineering discipline during the last 20 years. Microscopy has proved to be by far the most powerful technique for examining and understanding materials microstructures. Its methods are essential for developing new engineering materials of all types...read more

Product Description: A clear description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, detectors, image construction, image processing, vacuum generation and energy and wavelength dispersive X-ray spectroscopy...read more

Product Description: In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes...read more (view table of contents, read Amazon.com's description)

Product Description: The invention of an instrument called the OPTICAL MICROSCOPE and the new possibilities it offered to observe living material must be considered a major milestone in the advance of our understanding of the mechanisms of life. Huge numbers of important observations have been made using this instrument, but unfortunately it only produces twodimensional images...read more

Product Description: This practical introduction to the use of scanning electron microscopy (SEM) covers in detail instrumentation, sample preparation, and X-ray microanalysis and instrumentation. Emphasis is on developing an understanding of SEM and becoming proficient at its procedures...read more