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Dale E. Newbury has written 5 work(s)
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Cover for 9780306448584 Cover for 9781461357384 Cover for 9780306421402 Cover for 9781475790290 Cover for 9780306472923 Cover for 9780306441752 Cover for 9780306438240
cover image for 9781461357384
Product Description: From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly...read more
By Joseph I. Goldstein (editor), Dale E. Newbury (editor) and David B. Williams (editor)

Hardcover:

9780306448584 | Plenum Pub Corp, March 31, 1995, cover price $239.00

Paperback:

9781461357384 | Reprint edition (Springer Verlag, October 21, 2012), cover price $239.00 | About this edition: From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly.

cover image for 9781475790290

Hardcover:

9780306421402 | Plenum Pub Corp, February 1, 1986, cover price $149.00

Paperback:

9781475790290 | Reprint edition (Springer Verlag, June 8, 2013), cover price $139.00

cover image for 9780306472923
Product Description: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described...read more (view table of contents, read Amazon.com's description)

Hardcover:

9780306472923 | 3 sub edition (Plenum Pub Corp, December 1, 2002), cover price $99.00 | About this edition: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.

cover image for 9780306441752
Product Description: In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes...read more (view table of contents, read Amazon.com's description)

Hardcover:

9780306441752 | Plenum Pub Corp, June 1, 1992, cover price $99.00 | About this edition: In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA.

cover image for 9780306438240
Product Description: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations...read more

Hardcover:

9780306438240 | Plenum Pub Corp, June 1, 1991, cover price $229.00 | About this edition: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967.

displaying 1 to 5 | at end