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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM | Principles and Prevention of Corrosion | Electron Microprobe Analysis and Scanning Electron Microscopy in Geology | Transmission Electron Microscopy | Kinetics Of Materials | The Basics of Crystallography and Diffraction | Transmission Electron Microscopy | Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis | Introduction to Crystallography
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
About: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.
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