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Product Description: Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing...read more
By John T. L. Thong (editor)

Hardcover:

9780306443602 | Plenum Pub Corp, June 1, 1993, cover price $249.00 | About this edition: Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.

Paperback:

9781489915245 | Reprint edition (Springer Verlag, June 4, 2013), cover price $249.00 | About this edition: Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.

displaying 1 to 1 | at end