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By
John T. L. Thong (editor)
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Bibliographic Detail
Publisher
Springer Verlag
Publication date
June 4, 2013
Pages
478
Binding
Paperback
Edition
Reprint
Book category
Adult Non-Fiction
ISBN-13
9781489915245
ISBN-10
1489915249
Dimensions
0 by 7 by 10 in.
Original list price
$249.00
Other format details
sci/tech
Summaries and Reviews
Amazon.com description: Product Description: Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.
Editions
Hardcover
from Plenum Pub Corp (June 1, 1993)
9780306443602 | details & prices | 6.75 × 10.25 × 1.25 in. | 2.30 lbs | List price $249.00
About: Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.
About: Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.
Paperback
The price comparison is for this edition
Reprint edition from Springer Verlag (June 4, 2013)
9781489915245 | details & prices | 478 pages | List price $249.00
About: Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.
About: Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.
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