Results for James W. Mayer

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James W. Mayer has written 14 work(s)

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Ion Beam Analysis: Fundamentals and Applications

Product Description: Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization...read more

By James W. Mayer, Michael Nastasi and Yongqiang Wang

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Hardcover:

9781439846384 | CRC Pr I Llc, August 27, 2014, cover price $129.95 | About this edition: Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects.

Silver Metallization: Stability and Reliability

Product Description: Here is the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology. With the lowest resistivity of all metals, silver is an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits...read more

By James W. Mayer

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Hardcover:

9781848000261 | Springer Verlag, January 1, 2008, cover price $209.00

Paperback:

9781849967051 | Springer Verlag, December 16, 2011, cover price $209.00 | About this edition: Here is the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology.

Patterns of Light: Chasing the Spectrum from Aristotle to LEDs

Product Description: Any student or engineer working in optics or the field of laser technology will find this a fascinating read. The book begins by addressing the properties of light as seen in the everyday world: events such as refraction in a pool, lenses in the form of glasses, the colors of objects, and atmospheric events...read more

By Steven Beeson and James W. Mayer

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Hardcover:

9780387751061 | 1 edition (Springer Verlag, January 3, 2008), cover price $109.00 | About this edition: Any student or engineer working in optics or the field of laser technology will find this a fascinating read.

Paperback:

9781441925794 | Springer Verlag, November 19, 2010, cover price $109.00 | About this edition: Any student or engineer working in optics or the field of laser technology will find this a fascinating read.

Fundamentals of Nanoscale Film Analysis: Fundamentals and Techniques

Product Description: From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces...read more

By James W. Mayer

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Paperback:

9781441939807 | Springer Verlag, October 29, 2010, cover price $109.00 | About this edition: From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale.

Fundamentals of Nanoscale Film Analysis

By Terry L. Alford, Leonard C. Feldman and James W. Mayer

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Hardcover:

9780387292601 | Springer Verlag, June 30, 2007, cover price $109.00 | About this edition: From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale.

Ion Implantation and Synthesis of Materials

Product Description: Ion implantation is one of the key processing steps in silicon integrated circuit technology. Some integrated circuits require up to 17 implantation steps and circuits are seldom processed with less than 10 implantation steps. Controlled doping at controlled depths is an essential feature of implantation...read more

By James W. Mayer

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Paperback:

9783642062599 | Springer Verlag, August 9, 2006, cover price $169.00 | About this edition: Ion implantation is one of the key processing steps in silicon integrated circuit technology.

Ion-solid Interactions: Fundamentals And Applications

Product Description: Modern technology depends on materials with precisely controlled properties. Ion beams are an excellent way to achieve controlled modification of surface and near-surface regions. In every integrated circuit production line, for example, there are ion implantation systems...read more

By James K. Hirvonen, James W. Mayer and Michael Anthony Nastasi

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Hardcover:

9780521373760 | Cambridge Univ Pr, April 1, 1996, cover price $274.99 | About this edition: Modern technology depends on materials with precisely controlled properties.

Paperback:

9780521616065 | Cambridge Univ Pr, December 2, 2004, cover price $139.99 | About this edition: Modern technology depends on materials with precisely controlled properties.

The Science of Paintings

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By Peter Kuniholm, James W. Mayer, Richard Newman, Dusan Stulik, Stanley Taft and W. Stanley Taft

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Hardcover:

9780387987224 | Springer Verlag, June 1, 2000, cover price $79.95

Advanced Metallization for Future Ulsi: Symposium Held April 8-11, 1996, San Francisco, California, U.S.A.

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By Lih J. Chen (editor), James W. Mayer (editor), J. M. Poate (editor) and K. N. Tu (editor)

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Hardcover:

9781558993303 | Materials Research Society, June 1, 1996, cover price $39.99

Electronic Thin Film Science: For Electrical Engineers and Materials Scientists

Product Description: Book by Tu, King-Ning, Mayer, James W., Feldman, Leonard C.

By Leonard C. Feldman, James W. Mayer and King-Ning Tu

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Hardcover:

9780024215758 | Facsimile edition (Prentice Hall, January 1, 1992), cover price $84.60 | About this edition: Book by Tu, King-Ning, Mayer, James W.

Electronic Materials Science: For Integrated Circuits in Si and Gaas

Product Description: For an advanced undergrad/first grad course in materials science, covering thin film materials.

By S. S. Lau and James W. Mayer

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Paperback:

9780023781407 | Facsimile edition (Prentice Hall, February 1, 1990), cover price $175.60 | About this edition: For an advanced undergrad/first grad course in materials science, covering thin film materials.

Fundamentals of Surface and Thin Film Analysis

Product Description: This book discusses" the physics underlying the techniques used to anaylze the surface region of materials. It addresses the fundamentals of the few processes that govern the interactions of particles and radiation with matter."

By Leonard C. Feldman and James W. Mayer

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Hardcover:

9780135005705 | Facsimile edition (Prentice Hall, August 1, 1986), cover price $110.00 | About this edition: This book discusses" the physics underlying the techniques used to anaylze the surface region of materials.

Laser Annealing of Semiconductors

By James W. Mayer and J. M. Poate

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Hardcover:

9780125588201 | Academic Pr, January 1, 1983, cover price $103.00

Ion Beam Handbook for Materials Analysis

Product Description: Ion Beam Handbook for Material Analysis emerged from the U.S.-Italy Seminar on Ion Beam Analysis of Near Surface Regions held at the Baia-Verde Hotel, Catania, June 17-20, 1974. The seminar was sponsored by the National Science Foundation and the Consiglio Nazionale delle Ricerche under the United States-Italy Cooperative Science Program...read more

By James W. Mayer and E. Rimini (editor)

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Hardcover:

9780124808607 | Academic Pr, June 1, 1977, cover price $72.95 | About this edition: Ion Beam Handbook for Material Analysis emerged from the U.

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