Results for Joseph I. Goldstein

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Joseph I. Goldstein has written 5 work(s)

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X-Ray Spectrometry in Electron Beam Instruments

Product Description: From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly...read more

By Joseph I. Goldstein (editor), Dale E. Newbury (editor) and David B. Williams (editor)

See complete details on each edition (2 editions listed)

Hardcover:

9780306448584 | Plenum Pub Corp, March 31, 1995, cover price $239.00

Paperback:

9781461357384 | Reprint edition (Springer Verlag, October 21, 2012), cover price $239.00 | About this edition: From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly.

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

By Patrick Echlin, Charles E. Fiori, Joseph I. Goldstein, David C. Joy and Dale E. Newbury

See complete details on each edition (2 editions listed)

Hardcover:

9780306421402 | Plenum Pub Corp, February 1, 1986, cover price $149.00

Paperback:

9781475790290 | Reprint edition (Springer Verlag, June 8, 2013), cover price $139.00

Scanning Electron Microscopy and X-Ray Microanalysis

Product Description: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described...read more (view table of contents, read Amazon.com's description)

By Joseph I. Goldstein (editor), David C. Joy, Patrick Kchlin, Eric Lifshin, Charles E. Lyman, Dale E. Newbury and Linda Sawyer

See complete details on each edition (1 edition listed)

Hardcover:

9780306472923 | 3 sub edition (Plenum Pub Corp, December 1, 2002), cover price $99.00 | About this edition: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

Product Description: In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. HighÂ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes...read more (view table of contents, read Amazon.com's description)

By Patrick Echlin, Joseph I. Goldstein, David C. Joy, Dale E. Newbury and Ro

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Hardcover:

9780306441752 | Plenum Pub Corp, June 1, 1992, cover price $99.00 | About this edition: In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA.

Principles of Analytical Electron Microscopy

Product Description: Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization...read more

By Joseph I. Goldstein (editor), David C. Joy and Alton D. Romig

See complete details on each edition (1 edition listed)

Hardcover:

9780306423871 | Plenum Pub Corp, August 1, 1986, cover price $169.00 | About this edition: Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed.

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