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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy
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Hardcover
from John Wiley & Sons Inc (January 9, 2001)
9780471492405 | details & prices | 269 pages | 6.25 × 9.25 × 1.00 in. | 1.15 lbs | List price $277.00
About: Fault detection has become increasingly difficult as integrated circuits become more and more complex.
About: Fault detection has become increasingly difficult as integrated circuits become more and more complex.