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Optical Metrology
Descriptions of each edition are found in brief where available. Click details & prices to get more information on a book or to find the best prices for the title.
2 SUB
2 sub edition from John Wiley & Son Ltd (July 1, 1996)
9780471954743 | details & prices | 7.00 × 10.25 × 1.00 in. | 1.70 lbs | List price $220.00
About: Modern sources of radiation, modulators, beam scanners, photo detectors and computer-assisted detection, and display of information have contributed to the growing interest in the use of optical technology to solve a wide variety of measurement problems.
About: Modern sources of radiation, modulators, beam scanners, photo detectors and computer-assisted detection, and display of information have contributed to the growing interest in the use of optical technology to solve a wide variety of measurement problems.
3
3 edition from John Wiley & Sons Inc (March 24, 2003)
9780470846704 | details & prices | 372 pages | List price $110.00
3 edition from John Wiley & Sons Inc (October 29, 2002)
9780470843000 | details & prices | 352 pages | 6.75 × 9.75 × 1.00 in. | 1.85 lbs | List price $133.00
3 ONL
3 onl edition from John Wiley & Sons Inc (April 28, 2003)
9780470855607 | details & prices | 372 pages | List price $110.00
none
With Margie Rynn, Tristan Rutherford, Mary Novakovich, Kathryn Tomasetti, Lily Heise |
from John Wiley & Sons Inc (April 1, 1999)
9780471955283 | details & prices | List price $89.95
This edition also contains Frommer's Easyguide 2016 to France
About: Modern sources of radiation, modulators, beam scanners, photo detectors and computer-assisted detection, and display of information have contributed to the growing interest in the use of optical technology to solve a wide variety of measurement problems.
This edition also contains Frommer's Easyguide 2016 to France
About: Modern sources of radiation, modulators, beam scanners, photo detectors and computer-assisted detection, and display of information have contributed to the growing interest in the use of optical technology to solve a wide variety of measurement problems.