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Eberhard Umbach has written 4 work(s)
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Cover for 9783642721083 Cover for 9783642786341 Cover for 9783642238055 Cover for 9783540639985
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By Eberhard Umbach (editor)

Paperback:

9783642721083, titled "X-ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996" | Pap/psc edition (Springer Verlag, August 23, 2014), cover price $99.00

cover image for 9783642786341
Product Description: Adsorption on Ordered Surfaces of Ionic Solids and Thin Films introduces to a new and topical field of surface science for which rather little experience is available at present. It reviews the recent results of the employed analytical methods comprising all modern surface techniques including scanning tunneling microscopy and various kinds of electron spectroscopies...read more
By Hans-Joachim Freund (editor) and Eberhard Umbach (editor)

Paperback:

9783642786341 | Reprint edition (Springer Verlag, January 4, 2012), cover price $139.00 | About this edition: Adsorption on Ordered Surfaces of Ionic Solids and Thin Films introduces to a new and topical field of surface science for which rather little experience is available at present.

cover image for 9783642238055
Product Description: Als Reaktion auf die Havarie im japanischen Kernkraftwerk Fukushima Daiichi wird Deutschland als erstes Industrieland der Welt innerhalb von rund einem Jahrzehnt vollständig aus der Kernkraft aussteigen. Mit dem Beschluss über den Ausstieg aus der Kernenergie wird Deutschland aber nicht über Nacht kerntechnikfrei...read more
By Eberhard Umbach (editor)

Paperback:

9783642238055 | Springer Verlag, October 9, 2011, cover price $39.99 | About this edition: Als Reaktion auf die Havarie im japanischen Kernkraftwerk Fukushima Daiichi wird Deutschland als erstes Industrieland der Welt innerhalb von rund einem Jahrzehnt vollständig aus der Kernkraft aussteigen.

cover image for 9783540639985
Product Description: This book gives a status report of the developing analytical technique of X-ray microscopy. The technique allows the highest resolution in electromagnetic-wave microscopy. In addition to the systematic treatment of this subject in the book a CD is included that presents the latest special results reported at the 1996 conference on X-ray microscopy...read more
By Dietbert Rudolph (editor), Gunter Schmahl (editor), Jurgen Thieme (editor) and Eberhard Umbach (editor)

Hardcover:

9783540639985 | Springer Verlag, June 1, 1998, cover price $99.00 | About this edition: This book gives a status report of the developing analytical technique of X-ray microscopy.

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