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X-Ray Microscopy II
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Product Description: This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub­ ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986...read more
By M. Howells, J. Kirz, H. Rarback (editor) and D. Sayre
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Hardcover:

9780387193922 | Springer Verlag, October 1, 1988, cover price $99.00 | About this edition: This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987.

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