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Product Description: One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase...read more
By Inez Mureinik (editor)

Paperback:

9781461395379 | Reprint edition (Springer Verlag, December 27, 2011), cover price $119.00 | About this edition: One of the most important techniques for determining the atomic structure of a material is X-ray diffraction.

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