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R. Van Grieken has written 5 work(s)
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Cover for 9780444507389 Cover for 9780824706005 Cover for 9780471959359 Cover for 9780824784836 Cover for 9780471823643
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Product Description: This book provides the scientific and technical background materials of non-destructive methods of microscopic analysis that are suitable for analysing works of art, museum pieces and archeaological artefacts. Written by experts in the field, this multi-author volume contains a number of case studies, illustrating the value of these methods...read more
By R. Van Grieken (editor) and K. Janssens (editor)

Hardcover:

9780444507389 | Elsevier Science Ltd, January 26, 2005, cover price $375.00 | About this edition: This book provides the scientific and technical background materials of non-destructive methods of microscopic analysis that are suitable for analysing works of art, museum pieces and archeaological artefacts.

By R. Van Grieken (editor), Andrzej A. Markowicz (editor) and Rene E. Van Grieken (editor)

Hardcover:

9780824706005 | 2 rev exp edition (CRC Pr I Llc, December 1, 2001), cover price $385.00

Hardcover:

9780471959359 | John Wiley & Sons Inc, March 1, 1998, cover price $700.00

cover image for 9780824784836
Product Description: Provides coverage of all aspects of X-ray spectrometry, including thorough treatments of each X-ray emission analysis technique. The book brings together in-depth discussions of radioisotope X-ray analysis, synchrotron radiation-induced X-ray emission, total reflection X-ray fluorescence analysis and polarized beam X-ray fluorescence analysis...read more

Hardcover:

9780824784836 | Marcel Dekker Inc, September 1, 1992, cover price $265.00 | About this edition: Provides coverage of all aspects of X-ray spectrometry, including thorough treatments of each X-ray emission analysis technique.

cover image for 9780471823643
Product Description: Also from the Wiley Series in Chemical Analysis. Secondary Ion Mass Spectroscopy Basic Concepts, Instrumental Aspects, Applications and Trends A. Benninghoven and H. W. Werner Virtually a handbook on this important analytical technique, here is the most thorough presentation of secondary ion mass spectrometry (SIMS) ever compiled...read more (view table of contents, read Amazon.com's description)
By F. Adams (editor), R. Gijbels (editor) and R. Van Grieken (editor)

Hardcover:

9780471823643 | Wiley-Interscience, March 1, 1988, cover price $368.00 | About this edition: Also from the Wiley Series in Chemical Analysis.

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