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John W. Evans has written 10 work(s)
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Cover for 9780803249523 Cover for 9781447110651 Cover for 9781852332150 Cover for 9781447110651 Cover for 9780872638679 Cover for 9781846283093 Cover for 9781849965774 Cover for 9780471594369 Cover for 9780962677205 Cover for 9780962677212 Cover for 9780674502758

Paperback:

9780803295223 | Univ of Nebraska Pr, January 1, 2017, cover price $19.95

cover image for 9780803249523

Paperback:

9780803249523 | Univ of Nebraska Pr, March 1, 2014, cover price $19.95

cover image for 9781447110651
Product Description: The book develops the root-cause approach to reliability - often referred to as "physics of failure" in the reliability engineering field. It approaches the subject from the point of view of a process and integrates the necessary methods to support that process...read more
By Jillian Y. Evans (editor) and John W. Evans (editor)

Paperback:

9781447110651 | Reprint edition (Springer Verlag, September 10, 2012), cover price $249.00 | also contains Product Integrity and Reliability in Design | About this edition: The book develops the root-cause approach to reliability - often referred to as "physics of failure" in the reliability engineering field.
9781852332150 | Springer Verlag, March 1, 2001, cover price $249.00 | About this edition: The book develops the root-cause approach to reliability - often referred to as "physics of failure" in the reliability engineering field.

cover image for 9781447110651
Product Description: The book develops the root-cause approach to reliability - often referred to as "physics of failure" in the reliability engineering field. It approaches the subject from the point of view of a process and integrates the necessary methods to support that process...read more
By Jillian Y. Evans (editor) and John W. Evans (editor)

Paperback:

9781447110651 | Reprint edition (Springer Verlag, September 10, 2012), cover price $249.00 | also contains Product Integrity and Reliability in Design | About this edition: The book develops the root-cause approach to reliability - often referred to as "physics of failure" in the reliability engineering field.

cover image for 9780872638679
Product Description: For over 40 years, students, designers, and manufacturing practitioners have used the Fundamentals of Tool Design to gain an in-depth understanding of all the factors that impact tool success. Fully illustrated, readers will find practical design examples, cost analysis calculations, process data, operating parameters, and tips and techniques--all of the concrete knowledge needed to spark innovation and resolve complex tooling challenges...read more
By William Dufraine (contributor), John W. Evans (contributor), Mark Hill (contributor) and John G. Nee (editor)

Hardcover:

9780872638679 | 6 har/dvd edition (Society of Manufacturing, May 1, 2010), cover price $110.00 | About this edition: For over 40 years, students, designers, and manufacturing practitioners have used the Fundamentals of Tool Design to gain an in-depth understanding of all the factors that impact tool success.

cover image for 9781846283093
Product Description: The book is important because it reflects a trend, especially in microelectronics manufacture toward recyclability. Europe and Asia are moving towards legislation to ban the use of lead in solders and public demand in the US will likely have the same result...read more
By Werner Engelmaier (editor), Jillian Y. Evans (contributor), John W. Evans and Dongil Kwon (contributor)

Hardcover:

9781846283093 | Springer Verlag, April 30, 2007, cover price $169.00 | About this edition: The book is important because it reflects a trend, especially in microelectronics manufacture toward recyclability.

cover image for 9781849965774
Product Description: The book is important because it reflects a trend, especially in microelectronics manufacture toward recyclability. Europe and Asia are moving towards legislation to ban the use of lead in solders and public demand in the US will likely have the same result...read more
By Werner Engelmaier (editor), John W. Evans and Dong-il Kwon (contributor)

Paperback:

9781849965774 | Springer Verlag, April 30, 2007, cover price $169.00 | About this edition: The book is important because it reflects a trend, especially in microelectronics manufacture toward recyclability.

cover image for 9780471594369
Product Description: Quality Conformance and Qualification of Microelectronic Packages and Interconnects (view table of contents, read Amazon.com's description)

Hardcover:

9780471594369 | Wiley-Interscience, November 21, 1994, cover price $175.00 | About this edition: Quality Conformance and Qualification of Microelectronic Packages and Interconnects

cover image for 9780962677212
Product Description: Book by Evans, John W.

Hardcover:

9780962677205 | Pika Pr, February 1, 1991, cover price $32.95

Paperback:

9780962677212 | Pika Pr, February 1, 1991, cover price $22.95 | About this edition: Book by Evans, John W.

displaying 1 to 10 | at end