Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Product Description: This volume aims to disseminate a number of new ideas that have emerged in the last few years in the field of numerical simulation, all bearing the common denominator of the "multiscale" or "multilevel" paradigm. This covers the presence of multiple relevant "scales" in a physical phenomenon; the detection and representation of "structures", localized in space or in frequency, in the solution of a mathematical model; the decomposition of a function into "details" that can be organized and accessed in decreasing order of importance; and the iterative solution of systems of linear algebraic equations using "multilevel" decompositions of finite dimensional spaces...read more

Product Description: This latest volume in the Wavelets Analysis and Its Applications Series provides significant and up-to-date insights into recent developments in the field of wavelet constructions in connection with partial differential equations...read more (view table of contents, read Amazon.com's description)