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Advances in X-Ray Analysis
By John C. Russ (editor)
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Bibliographic Detail
Publisher Springer Verlag
Publication date July 24, 2012
Binding Paperback
Edition 25 reprint
Book category Adult Non-Fiction
ISBN-13 9781461399957
ISBN-10 1461399955
Original list price $99.00
Other format details sci/tech
Summaries and Reviews
Amazon.com description: Product Description: In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif­ fraction. This is a "fluorescence" year, and the three invited lecturers are experts in techniques that are at, or perhaps yet a bit beyond, the forefront of our understanding and technology in that field. The common denominator in selecting these subjects was that each is approaching a full elucidation of theory, and active develop­ ment of practical hardware, and that each presents analytical pos­ sibilities which can hardly be ignored in the next generation of commercial instrumentation. In other words, these are techniques that many of us shall likely find ourselves using by the end of the decade. The greatest difficulty in selecting the subjects was the need to overlook others, particularly 1) the increasing inter­ est in "in-situ" or on-line analytical control, for tagging, identi­ fication or sorting; and 2) the broad subject of the computeriza­ tion of instrumentation, with its powerful impact on the design of hardware, and its open invitation to the theorist to create more exact mathematical models of the analytical process, regardless of complexity, in the expectation that programmers will find ways to implement solutions in affordable, dedicated computers.

Editions
Paperback
Book cover for 9781461399957 Book cover for 9781475791129
 
With Ron Jenkins (other contributor), J. V. Gilfrich (other contributor), Charles S. Barrett (other contributor), J. W. Richardson, Jr. (other contributor) | Reprint edition from Springer Verlag (June 18, 2013)
9781475791129 | details & prices | List price $289.00
About: The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado.
The price comparison is for this edition
25 reprint edition from Springer Verlag (July 24, 2012)
9781461399957 | details & prices | List price $99.00
About: In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif­ fraction.

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