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reliability engineering matches 507 work(s)
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Hardcover:
9781851662029 | Kluwer Academic Pub, May 1, 1988, cover price $99.00 | About this edition: Very good condition.
Paperback:
9789401071031 | Springer Verlag, October 1, 2011, cover price $99.00
Hardcover:
9781851664849 | Kluwer Academic Pub, May 1, 1990, cover price $329.00 | About this edition: On behalf of the Organising Committee of the 11th ARTS I would like to welcome all the delegates, session chairpersons and authors.
Paperback:
9789401068284 | Springer Verlag, October 28, 2011, cover price $99.00 | About this edition: On behalf of the Organising Committee of the 11th ARTS I would like to welcome all the delegates, session chairpersons and authors.
Hardcover:
9780738115474 | Inst of Elect & Electronic, July 1, 1999, cover price $55.00
Product Description: A study of reliable distributed systems, taken from the 17th Symposium on Reliable Distributed Systems. It examines message logging, replicated objects, wireless systems, distributed software environments, the Internet, process groups and database systems.
Paperback:
9780818692185 | IEEE Computer Society, November 1, 1998, cover price $110.00 | About this edition: A study of reliable distributed systems, taken from the 17th Symposium on Reliable Distributed Systems.
Product Description: Book by International Integrated Reliability Workshop (2001 : Lake Tahoe, Calif.)
Paperback:
9780780319080 | IEEE, December 1, 1995, cover price $90.00 | About this edition: Book by International Integrated Reliability Workshop (2001 : Lake Tahoe, Calif.
Paperback:
9780780320314 | IEEE, December 1, 1995, cover price $106.00
Hardcover:
9780780330931 | IEEE, April 1, 1997, cover price $134.00
Hardcover:
9780780331129 | IEEE, April 1, 1997, cover price $118.00
Paperback:
9780780327535 | IEEE, April 1, 1997, cover price $120.00 | About this edition: We look to historians for reliable information about the past.
Paperback:
9780780335981 | IEEE, April 1, 1997, cover price $100.00 | About this edition: The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability.
Hardcover:
9780780335752 | IEEE, January 1, 1998, cover price $132.00
Product Description: This text examines radiation effects on components and system reliability. The integration of VLSI into vehicles and transportation equipment, health and life support systems, and other safety requiring areas of commerce and society make this an important design and application issue...read more
Paperback:
9780780340718 | IEEE, July 1, 1997, cover price $154.00 | About this edition: This text examines radiation effects on components and system reliability.
Paperback:
9780780344006 | IEEE, May 1, 1998, cover price $138.00
Hardcover:
9780780352209 | 37 edition (IEEE, June 1, 1999), cover price $140.00 | About this edition: This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability.
Paperback:
9781877862663 | Inst of Environmental Sciences, May 1, 1999, cover price $195.00
Paperback:
9780780363922 | IEEE, January 1, 2001, cover price $130.00 | About this edition: A final report on the IEEE International Integrated Reliability Workshop 2000.
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Paperback:
9780780358607 | 38 edition (IEEE, June 1, 2000), cover price $158.00
Paperback:
9780780371675 | IEEE, January 1, 2002, cover price $140.00
Paperback:
9780780365872 | IEEE, June 1, 2001, cover price $174.00 | About this edition: Based on a reliability physics symposium, this CD-ROM covers topics including: device and process; device dielectrics; assembly and packaging; channel hot carriers; interconnects; ESD and latch-up; process induced damage; failure analysis; reliability; and optoelectronic emitters and detectors.
Product Description: Based on the 2001 IEEE International Reliability Physics Symposium, this electronic reference covers such topics as: device and process; device dielectrics; assembly and packaging; channel hot carriers; interconnects; ESD and latch-up; process induced damage; and failure analysis...read more
Hardcover:
9780780365896 | 39 cdr edition (IEEE, June 1, 2001), cover price $174.00 | About this edition: Based on the 2001 IEEE International Reliability Physics Symposium, this electronic reference covers such topics as: device and process; device dielectrics; assembly and packaging; channel hot carriers; interconnects; ESD and latch-up; process induced damage; and failure analysis.
Paperback:
9780780304734 | IEEE, April 1, 1992, cover price $92.00
Paperback:
9780915414376 | Inst of Environmental Sciences, December 1, 1988, cover price $125.00
Hardcover:
9780405130410 | Ayer Co Pub, June 1, 1980, cover price $25.95 | also contains Reliability, Maintainability, and Supportability: Best Practices for Systems Engineers
Hardcover:
9781584881865 | Chapman & Hall, November 1, 2001, cover price $169.95 | About this edition: The authors of this monograph have developed a large and important class of survival analysis models that generalize most of the existing models.
Hardcover:
9780444871015 | Elsevier Science Ltd, September 1, 1988, cover price $217.00 | About this edition: Prominent statisticians and reliability experts contributed to this book which is of interest to reliability theoreticians and analysts.
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