Product Description: Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-based robust product and process development methodology...read more

Product Description: Readers will find all that is required to implement a successful accelerated reliability program in this groundbreaking book. It has been prepared with both novices and experts in mind. It has been written so that either can find information that will aid them in their quest to produce high-reliability products without getting bogged down in equations...read more

Product Description: Drawing of real-world issues and with supporting data from industry, this book overviews the technique and equipment available to engineers and scientists to identify the solutions of the physical essence of engineering problems in simulation, accelerated testing, prediction, quality improvement, and risk during the design, manufacturing, and maintenance stages...read more

Product Description: Early approaches to accelerated testing were based on the assumption that there was a simple acceleration factor that would correspond to a linear scaling of time from the operating stress to the accelerating stress. This corresponds to the simplest physical model of the kinetics governing the underlying degradation, but this simple model does not always hold...read more

Product Description: This comprehensive new volume examines the latest advances and innovations in weathering and durability testing. 13 peer-reviewed papers are divided into these sections: Material Characterization--4 papers explore the characteristics of materials that have been subjected to exposure tests...read more (view table of contents, read Amazon.com's description)

Product Description: Practical accelerated testing, otherwise known as environmental stress screening, is becoming a popular industry alternative to on-going product reliability engineering. By simulating component weaknesses and failures in an accelerated test chamber, failures that appear later in the product's life in real time are exposed during the design phase...read more (view table of contents, read Amazon.com's description)

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Product Description: Written by a renowned expert in the field, this book presents an overview of the results of research using accelerated aging tests. The emphasis is on the chemical aspects of photochemical stability, but thermally initiated deterioration is also discussed...read more

Product Description: The second volume in this comprehensive two-volume series provides information, procedures, tests and illustrations helping engineers analyze time-to-failure data to ensure greater reliability in the products they design. Volume II includes up-to-date information on Accept-Reject tests, the Sequential Probability Radio Test, Bayesian MTBF and Reliability Demonstration Tests, as well as some very important accelerated tests including Arrhenius, Eyriing, Bazovsky, Inverse Power Law and many others...read more

Product Description: Textbook for a methods course or reference for an experimenter who is mainly interested in data analyses rather than in the mathematical development of the procedures. Provides the most useful statistical techniques, not only for the normal distribution, but for other important distributions, such ...read more