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Recent Developments in Thin Film Research: Epitaxial Growth and Nanostructures, Electron Microscopy and X-Ray Diffraction
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Product Description: The ICAM'97 symposium on "Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures" was presented at the combined 1997 International Conference on Applied Materials/European Materials Research Society Spring meeting (ICAM'97/E-MRS'97) held in Strasbourg (France) from 16-20 June 1997...read more
By A. G. Cullis, C. Matthai, G. Ritter, A. M. Rocher, SYMPOSIUM B ON EPITAXIAL THIN FILM GROWT and O. Takai
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Hardcover:

9780444205131 | Elsevier Science Serials, July 1, 1998, cover price $570.00 | About this edition: The ICAM'97 symposium on "Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures" was presented at the combined 1997 International Conference on Applied Materials/European Materials Research Society Spring meeting (ICAM'97/E-MRS'97) held in Strasbourg (France) from 16-20 June 1997.

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