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A. G. Cullis has written 13 work(s)
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Cover for 9783540319146 Cover for 9780750309790 Cover for 9780750308182 Cover for 9780750306508 Cover for 9780444205131 Cover for 9780750304641 Cover for 9780750303477 Cover for 9780750302906 Cover for 9780854984060 Cover for 9780854980567 Cover for 9780854981786 Cover for 9780854981670
By A. G. Cullis (editor) and P. A. Midgley (editor)

Hardcover:

9781402086144 | Springer Verlag, November 19, 2008, cover price $359.00

Paperback:

9780135103067, titled "Jeanloup Sieff" | Olympic Marketing Corp, September 1, 1984, cover price $1.98 | also contains Jeanloup Sieff

cover image for 9783540319146
Product Description: The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction...read more
By A. G. Cullis (editor) and J. L. Hutchison (editor)

Hardcover:

9783540319146 | Springer Verlag, April 15, 2006, cover price $339.00 | About this edition: The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

cover image for 9780750309790
Product Description: Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microscopy...read more
By A. G. Cullis (editor) and P. A. Midgley (editor)

Hardcover:

9780750309790 | Inst of Physics Pub Inc, November 30, 2004, cover price $229.95 | About this edition: Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology.

cover image for 9780750308182
Product Description: The Institute of Physics Conference Series is a leading International medium for the rapid publication of proceedings of major conferences and symposia reviewing new developments in physics and related areas. Volumes in the series comprise original refereed papers and are regarded as standard referee works...read more

Hardcover:

9780750308182 | Taylor & Francis, February 1, 2002, cover price $189.95 | About this edition: The Institute of Physics Conference Series is a leading International medium for the rapid publication of proceedings of major conferences and symposia reviewing new developments in physics and related areas.

cover image for 9780750306508
Product Description: With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigate semiconducting structures...read more
By R. Beanland (editor) and A. G. Cullis (editor)

Hardcover:

9780750306508 | CRC Pr I Llc, March 1, 2000, cover price $533.00 | About this edition: With IC technology continuing to advance, the analysis of very small structures remains critically important.

cover image for 9780444205131
Product Description: The ICAM'97 symposium on "Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures" was presented at the combined 1997 International Conference on Applied Materials/European Materials Research Society Spring meeting (ICAM'97/E-MRS'97) held in Strasbourg (France) from 16-20 June 1997...read more

Hardcover:

9780444205131 | Elsevier Science Serials, July 1, 1998, cover price $570.00 | About this edition: The ICAM'97 symposium on "Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures" was presented at the combined 1997 International Conference on Applied Materials/European Materials Research Society Spring meeting (ICAM'97/E-MRS'97) held in Strasbourg (France) from 16-20 June 1997.

cover image for 9780750302906
Product Description: These proceedings contain the invited and contributed papers from the international MSM conference and present the work of many leaders in the field. The papers provide information on the most up-to-date advances in semiconductor microscopy spanning both fundamental research areas and developments in device processing technologies...read more

Hardcover:

9780750302906 | Inst of Physics Pub Inc, October 1, 1993, cover price $140.00 | About this edition: These proceedings contain the invited and contributed papers from the international MSM conference and present the work of many leaders in the field.

cover image for 9780854980567
Product Description: Microscopy of Semiconducting Materials 1989 brings together both the invited and contributed papers from this conference. The main subject areas covered include: high resolution microscopy, microanalysis, epitaxial layers, quantum wells and superlattices, bulk GaAs, X-ray studies, dielectric structures, silicides and metal-semiconductor contacts, device studies and advanced scanning microscopy techniques...read more

Hardcover:

9780854980567 | Inst of Physics Pub Inc, January 1, 1990, cover price $140.00 | About this edition: Microscopy of Semiconducting Materials 1989 brings together both the invited and contributed papers from this conference.

cover image for 9780854981786
Product Description: Usual shelf wear and minor soiling on FFEP. Overall a very good copy.

Hardcover:

9780854981786 | CRC Pr I Llc, January 1, 1988, cover price $231.00 | About this edition: Usual shelf wear and minor soiling on FFEP.

cover image for 9780854981670
Product Description: Provides an overview of developments in transmission and scanning electron microscopy to the study of the structure and electrical properties of semiconducting materials. Spans the range of elemental and compound semiconductors. Of interest to researchers in condensed matter, materials science and device physics...read more
By A. G. Cullis and D. B. Holt (editor)

Hardcover:

9780854981670 | Adam Hilger, March 1, 1986, cover price $140.00 | About this edition: Provides an overview of developments in transmission and scanning electron microscopy to the study of the structure and electrical properties of semiconducting materials.

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