Product Description: Covering topics that are especially important in electronic device development, this book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed...read more

Product Description: Microcharacterization of materials is a rapidly advancing field. Among the many electron and ion probe techniques, the cathodoluminescence mode of an electron probe instrument has reached a certain maturity, which is reflected by an increas­ ing number of publications in this field...read more

Product Description: "We live in what may be the most consumer-oriented society in history. . . .Once a purely utilitarian chore, shopping has been elevated to the status of a national passion."--Juliet B. Schor, The Overworked American. A unique and definitive reader on our "national passion"--buying stuff--and its consequences for American society...read more (view table of contents, read Amazon.com's description)

Product Description: Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope...read more

Product Description: Provides an overview of developments in transmission and scanning electron microscopy to the study of the structure and electrical properties of semiconducting materials. Spans the range of elemental and compound semiconductors. Of interest to researchers in condensed matter, materials science and device physics...read more