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Microscopy of Semiconducting Materials 1999: Proceedings of the Institute of Physics Conference Held at Oxford University, 22-25 March 1990
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Product Description: With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigate semiconducting structures...read more
By R. Beanland (editor) and A. G. Cullis (editor)
See complete details on each edition (1 edition listed)

Hardcover:

9780750306508 | CRC Pr I Llc, March 1, 2000, cover price $533.00 | About this edition: With IC technology continuing to advance, the analysis of very small structures remains critically important.

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