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Product Description: Also from the Wiley Series in Chemical Analysis. Secondary Ion Mass Spectroscopy Basic Concepts, Instrumental Aspects, Applications and Trends A. Benninghoven and H. W. Werner Virtually a handbook on this important analytical technique, here is the most thorough presentation of secondary ion mass spectrometry (SIMS) ever compiled...read more (view table of contents, read Amazon.com's description)
By F. Adams (editor), R. Gijbels (editor) and R. Van Grieken (editor)

Hardcover:

9780471823643 | Wiley-Interscience, March 1, 1988, cover price $368.00 | About this edition: Also from the Wiley Series in Chemical Analysis.

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