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Product Description: Also from the Wiley Series in Chemical Analysis. Secondary Ion Mass Spectroscopy Basic Concepts, Instrumental Aspects, Applications and Trends A. Benninghoven and H. W. Werner Virtually a handbook on this important analytical technique, here is the most thorough presentation of secondary ion mass spectrometry (SIMS) ever compiled...read more (view table of contents, read Amazon.com's description)
Hardcover:
9780471823643 | Wiley-Interscience, March 1, 1988, cover price $368.00 | About this edition: Also from the Wiley Series in Chemical Analysis.
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