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Product Description: Defect and Microstructure Analysis by Diffraction looks at a key aspect of state-of-the-art methods for analyzing the actual structure of materials. Diffraction analysis is typically based on idealized crystals. The impurities and irregularities that work themselves into virtually all crystal structures, however, cause diffraction peak profiles to broaden and sometimes become asymmetric, making the data difficult to interpret...read more (view table of contents, read Amazon.com's description)

Hardcover:

9780198501893 | Oxford Univ Pr on Demand, March 16, 2000, cover price $330.00 | About this edition: Defect and Microstructure Analysis by Diffraction looks at a key aspect of state-of-the-art methods for analyzing the actual structure of materials.

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