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Tables of Contents for Testing of Digital Systems
Chapter/Section Title
Page #
Page Count
1. Introduction
2. Fault models
3. Combinational logic and fault simulation
4. Test generation for combinational circuits
5. Sequential ATPG
6. IDDQ testing
7. Functional testing
8. Delay fault testing
9. CMOS testing
10. Fault diagnosis
11. Design for testability
12. Built-in self-test
13. Synthesis for testability
14. Memory testing
15. High-level test synthesis
16. System-on-a-chip testing
Index.