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x ray spectroscopy matches 89 work(s)
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Cover for 9781402060175 Cover for 9783540464242 Cover for 9783540286035 Cover for 9780080252667 Cover for 9780312352011 Cover for 9781402033360 Cover for 9780521352222 Cover for 9780521017534 Cover for 9780444514493 Cover for 9780471486404 Cover for 9781402002663 Cover for 9780824706005 Cover for 9780444507020 Cover for 9780471492672 Cover for 9780471492665 Cover for 9781563969263 Cover for 9781563967139 Cover for 9780471299424 Cover for 9780471836759 Cover for 9783540620297 Cover for 9783540639985
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Product Description: The search for table-top and repetitive pump schemes during the last decade has been the driving force behind the spectacular advances demonstrated during the 10th International Conference on X-Ray Lasers, organized in 2006 in Berlin...read more
By K. A. Janulewicz (editor) and P. V. Nickles (editor)

Hardcover:

9781402060175 | Springer Verlag, June 3, 2007, cover price $409.00 | About this edition: The search for table-top and repetitive pump schemes during the last decade has been the driving force behind the spectacular advances demonstrated during the 10th International Conference on X-Ray Lasers, organized in 2006 in Berlin.

cover image for 9783540464242
Product Description: This book demonstrates the applications of synchrotron radiation in certain aspects of cell microbiology, specifically non-destructive elemental analyses, chemical-state analyses and imaging (distribution) of the elements within a cell...read more

Hardcover:

9783540464242 | Springer Verlag, May 4, 2007, cover price $209.00 | About this edition: This book demonstrates the applications of synchrotron radiation in certain aspects of cell microbiology, specifically non-destructive elemental analyses, chemical-state analyses and imaging (distribution) of the elements within a cell.

cover image for 9783540286035
By B. Beckhoff (editor), B. Kanngiefer (editor), N. Langhoff (editor), R. Wedell (editor) and H. Wolff (editor)

Hardcover:

9783540286035 | Springer Verlag, June 30, 2006, cover price $529.00

cover image for 9780312352011
A young golfer from a small Irish community learns about how to play effectively in spite of an unusual swing, an endeavor that is marked by a host of personal problems on and off the course. By the author of The Last Resort. Reprint. 10,000 first printing.

Hardcover:

9780080252667, titled "Advances in X-Ray Spectroscopy: Contributions in Honour of Professor Y. Cauchois" | Pergamon Pr, December 1, 1982, cover price $115.00 | also contains Advances in X-Ray Spectroscopy: Contributions in Honour of Professor Y. Cauchois

Paperback:

9780312352011 | Reprint edition (Griffin, March 21, 2006), cover price $19.99 | About this edition: A young golfer from a small Irish community learns about how to play effectively in spite of an unusual swing, an endeavor that is marked by a host of personal problems on and off the course.

cover image for 9781402033360
By Erik Geissler (editor), Francoise Hippert (editor) and Jean-Louis Hodeau (editor)

Hardcover:

9781402033360 | Kluwer Academic Pub, January 15, 2006, cover price $189.00

cover image for 9780521017534
Product Description: This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials...read more

Hardcover:

9780521352222 | Cambridge Univ Pr, May 1, 1998, cover price $129.99 | About this edition: This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials.

Paperback:

9780521017534 | Cambridge Univ Pr, November 30, 2005, cover price $64.99 | About this edition: This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials.

"X-Ray Spectrometry: Recent Technological Advances" covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. It includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays. It introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends. It is written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields. Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, and New Applications. This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.
By Kouichi Tsuji (editor)

Hardcover:

9780471486404 | John Wiley & Sons Inc, April 30, 2004, cover price $580.00 | About this edition: "X-Ray Spectrometry: Recent Technological Advances" covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry.

Miscellaneous:

9780470020432 | Onl edition (John Wiley & Sons Inc, August 30, 2004), cover price $450.00

The synchrotron light source is becoming widely available, after its evolution from its infancy in the sixties to the present third generation source with insertion devices. It is timely to examine the impact that synchrotron light has made and will continue to make on chemical research. With this objective in mind, the editor of this invaluable book invited contributions from practitioners who are in the forefront of the research. The book summarizes most of the significant developments in the last decade in chemical and related research using synchrotron light. The utilization of the light as a probe as well as an energy source is emphasized.This book is organized into two parts, in order of increasing photon energy. Part I deals with the applications of low energy photons and covers areas such as gas phase photodissociation reactions and dynamics, soft X-ray fluorescence, IR and photoemission analysis of surfaces, spectroscopy of organic and polymeric materials, catalysts, electronic and magnetic materials, and spectromicroscopy. Part II encompasses applications using soft to hard X-rays, including spectroscopy of surface and thin films, XAFS, diffraction and scattering, and several technological applications, namely the microprobe, photoetching and tribology.
By Tsun-Kong Sham (editor)

Hardcover:

9789810244804 | World Scientific Pub Co Inc, July 1, 2002, cover price $345.00
9789810249779 | World Scientific Pub Co Inc, April 1, 2002, cover price $55.01 | About this edition: The synchrotron light source is becoming widely available, after its evolution from its infancy in the sixties to the present third generation source with insertion devices.
9789810249786 | World Scientific Pub Co Inc, April 1, 2002, cover price $55.01 | About this edition: The synchrotron light source is becoming widely available, after its evolution from its infancy in the sixties to the present third generation source with insertion devices.

By R. Van Grieken (editor), Andrzej A. Markowicz (editor) and Rene E. Van Grieken (editor)

Hardcover:

9780824706005 | 2 rev exp edition (CRC Pr I Llc, December 1, 2001), cover price $385.00

By John B. Higgins (editor) and M. M. J. Treacy (editor)

Paperback:

9780444507020 | 4 rev sub edition (Elsevier Science Ltd, June 12, 2001), cover price $220.00

Hardcover:

9780471498100 | John Wiley & Sons Inc, October 26, 2000, cover price $4665.00

cover image for 9780471492672
Product Description: Contains an invaluable collection of research grade XPS spectra, including comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported...read more (view table of contents, read Amazon.com's description)

Hardcover:

9780471492672 | John Wiley & Sons Inc, October 26, 2000, cover price $1750.00 | About this edition: Contains an invaluable collection of research grade XPS spectra, including comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra.

cover image for 9780471492665
Product Description: This handbook is one of three containing an invaluable collection of research grade XPS Spectra. Each handbook concentrates on a specific family of materials (the elements and their native oxides, semiconductors and polymers) and is entirely self-contained...read more (view table of contents, read Amazon.com's description)

Hardcover:

9780471492665 | John Wiley & Sons Inc, October 26, 2000, cover price $1750.00 | About this edition: This handbook is one of three containing an invaluable collection of research grade XPS Spectra.

By Freddy C. V. Adams (editor), Koen H. A. Janssens (editor) and Anders Rindby (editor)

Hardcover:

9780471974260 | John Wiley & Sons Inc, June 29, 2000, cover price $520.00

cover image for 9781563969263
Product Description: This volume is the status report of the international community of practitioners of x-ray microscopy. It contains the reviews and work presented at the 6th International Conference on X-Ray Microscopy held in Berkeley, 2-6 August 1999...read more
By D. Attwood (editor), W. Meyer Ilse (editor) and T. Warwick (editor)

Hardcover:

9781563969263 | Amer Inst of Physics, May 1, 2000, cover price $165.00 | About this edition: This volume is the status report of the international community of practitioners of x-ray microscopy.

Hardcover:

9780444820280 | Elsevier Science Ltd, May 1, 2000, cover price $262.01 | also contains Sphynx

cover image for 9781563967139
Product Description: This volume contains the written articles corresponding to the more than fifty invited presentations. Most of these articles provide current reviews of the status of various aspects of the field and are written by acknowledged experts...read more (view table of contents, read Amazon.com's description)
By R. W. Dunford (editor), D. S. Gemmell (editor), E. P. Kanter (editor), B. Krassig (editor), S. H. Southworth (editor) and L. Young (editor)

Hardcover:

9781563967139 | Amer Inst of Physics, April 1, 2000, cover price $135.00 | About this edition: This volume contains the written articles corresponding to the more than fifty invited presentations.

Hardcover:

9780471299424 | 2 sub edition (Wiley-Interscience, June 18, 1999), cover price $188.00
9780471836759 | Wiley-Interscience, October 1, 1988, cover price $119.00

cover image for 9783540620297
Product Description: This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:thickness, crystalline state, strain distribution, interface quality and other properties...read more (view table of contents, read Amazon.com's description)

Hardcover:

9783540620297 | Springer Verlag, March 1, 1999, cover price $159.95 | About this edition: This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:thickness, crystalline state, strain distribution, interface quality and other properties.

cover image for 9783540639985
Product Description: This book gives a status report of the developing analytical technique of X-ray microscopy. The technique allows the highest resolution in electromagnetic-wave microscopy. In addition to the systematic treatment of this subject in the book a CD is included that presents the latest special results reported at the 1996 conference on X-ray microscopy...read more
By Dietbert Rudolph (editor), Gunter Schmahl (editor), Jurgen Thieme (editor) and Eberhard Umbach (editor)

Hardcover:

9783540639985 | Springer Verlag, June 1, 1998, cover price $99.00 | About this edition: This book gives a status report of the developing analytical technique of X-ray microscopy.

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