Product Description: In 1979, a conference on x-ray microscopy was organized by the New York Academy of Sciences, and in 1983, the Second Interna­ tional Symposium on X-ray Imaging was organized by the Akademie der Wissenschaften in Gottingen, Federal Republic of Germany...read more

Product Description: This book gives a status report of the developing analytical technique of X-ray microscopy. The technique allows the highest resolution in electromagnetic-wave microscopy. In addition to the systematic treatment of this subject in the book a CD is included that presents the latest special results reported at the 1996 conference on X-ray microscopy...read more

Product Description: This book deals with the latest advances in high-resolution image formation using X-rays. The main topics treated are X-rays sources and optics, X-ray imaging using a variety of contrast mechanisms, theory, and technical aspects of microscopy...read more

Product Description: This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub­ ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986...read more

Product Description: An Institute like ours cannot help but lend credence to the notion of the late Derek J. de Solla Price of Yale University that "the scientific revolution was largely the improvement, invention and use of a series of instruments . ...read more