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Product Description: Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs...read more

Hardcover:

9780792399452 | Kluwer Academic Pub, May 1, 1997, cover price $249.00 | About this edition: Testing techniques for VLSI circuits are undergoing many exciting changes.

Paperback:

9781461378129 | Reprint edition (Springer Verlag, October 12, 2012), cover price $199.00 | About this edition: Testing techniques for VLSI circuits are undergoing many exciting changes.

displaying 1 to 1 | at end