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Product Description: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials...read more
Hardcover:
9780198556251 | Clarendon Pr, February 1, 1990, cover price $95.00 | About this edition: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis.
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