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Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
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Product Description: The international market is very competitive for high-tech manufacturers to­ day. Achieving competitive quality and reliability for products requires leader­ ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de­ sign tools and methods...read more
By Wei-Ting Kary Chien, Taeho Kim and Way Kuo
See complete details on each edition (2 editions listed)

Hardcover:

9780792381075 | Kluwer Academic Pub, December 1, 1997, cover price $309.00

Paperback:

9781461375968 | Springer Verlag, March 14, 2014, cover price $309.00 | About this edition: The international market is very competitive for high-tech manufacturers to­ day.

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