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Product Description: Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or electron channeling for local crystallographic information...read more (view table of contents, read Amazon.com's description)
By Brent L. Adams (editor), Mukul Kumar (editor) and Adam J. Schwartz (editor)

Hardcover:

9780306464874 | Kluwer Academic Pub, August 1, 2000, cover price $175.00 | About this edition: Crystallographic texture or preferred orientation has long been known to strongly influence material properties.

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