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Product Description: Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or electron channeling for local crystallographic information...read more (view table of contents, read Amazon.com's description)
Hardcover:
9780306464874 | Kluwer Academic Pub, August 1, 2000, cover price $175.00 | About this edition: Crystallographic texture or preferred orientation has long been known to strongly influence material properties.
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