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Tables of Contents for Characterization of Materials
Chapter/Section Title
Page #
Page Count
Nanoscale Characterization of Surfaces and Interfaces
1
158
N. J. Dinardo
Mechanical Spectroscopy
159
60
R. De Batist
Scanning Auger Microscopy
219
22
M. A. Baker
J. E. Castle
Quantitative Acoustic Microscopy
241
40
A. Briggs
Quantitative Description of Microstructures by Image Analysis
281
70
H.E. Exner
Electron Microprobe Analysis
351
72
E. Lifshin
High Energy Ion Beam Analysis Techniques
423
90
W. -K. Chu
J. Liu
Z. Zhang
K. B. Ma
Field-Ion Microscopy and Atom Probe Analysis
513
48
A. Cerezo
G. D. W. Smith
Neutron Diffraction
561
50
R. B. Von Dreele
Small-Angle Scattering of X-Rays and Neutrons
611
46
C. E. Williams
R. P. May
A. Guinier
Characterization of Surfaces, Interfaces, and Thin Films of Organic Materials
657
100
D. L. Allara
P. Zhang
Index
757