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Igor L. Markov has written 3 work(s)
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Cover for 9789048196432 Cover for 9789400797987 Cover for 9781461413554 Cover for 9781402093647 Cover for 9789048181124
cover image for 9789400797987
Product Description: Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling...read more

Hardcover:

9789048196432 | Springer Verlag, September 21, 2012, cover price $149.00

Paperback:

9789400797987 | Springer Verlag, October 15, 2014, cover price $149.00 | About this edition: Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation.

cover image for 9781461413554
Product Description: This book introduces techniques that advance the capabilities and strength of modern software tools for physical synthesis, with the ultimate goal to improve the quality of leading-edge semiconductor products.  It provides a comprehensive introduction to physical synthesis and takes the reader methodically from first principles through state-of-the-art optimizations used in cutting edge industrial tools...read more

Hardcover:

9781461413554 | Springer Verlag, August 8, 2012, cover price $149.00 | About this edition: This book introduces techniques that advance the capabilities and strength of modern software tools for physical synthesis, with the ultimate goal to improve the quality of leading-edge semiconductor products.

cover image for 9781402093647
Product Description: Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair...read more

Hardcover:

9781402093647 | Springer Verlag, February 1, 2009, cover price $189.00 | About this edition: Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die.

Paperback:

9789048181124 | Springer Verlag, February 1, 2009, cover price $189.00 | About this edition: Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die.

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