9781441999757, titled "High Quality Test Pattern Generation and Boolean Satisfiability: Robust Algorithms Using Boolean Satisfiability" | Springer Verlag, January 31, 2012, cover price $129.00 |
About this edition: This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).
9781489988478 | Springer Verlag, October 20, 2014, cover price $129.00 | also contains
High Quality Test Pattern Generation and Boolean Satisfiability |
About this edition: This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).