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Thin Film Analysis by X-Ray Scattering
By Mario Birkholz, Christoph Genzel (contributor) and Paul F. Fewster (contributor)
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Jump down to see edition details for: Hardcover | Miscellaneous | Miscellaneous
Bibliographic Detail
Publisher Vch Verlagsgesellschaft Mbh
Publication date February 28, 2006
Pages 356
Binding Hardcover
Book category Adult Non-Fiction
ISBN-13 9783527310524
ISBN-10 3527310525
Dimensions 0.75 by 6.75 by 9.50 in.
Weight 1.85 lbs.
Original list price $224.00
Other format details sci/tech
Amazon.com says people who bought this book also bought:
High-Resolution X-Ray Scattering
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Editions
Hardcover
Book cover for 9783527310524
 
The price comparison is for this edition
from Vch Verlagsgesellschaft Mbh (February 28, 2006)
9783527310524 | details & prices | 356 pages | 6.75 × 9.50 × 0.75 in. | 1.85 lbs | List price $224.00
Miscellaneous
from John Wiley & Sons Inc (November 29, 2010)
9780470904688 | details & prices | 1088 pages | List price $24.99
Miscellaneous
from John Wiley & Sons Inc (June 12, 2006)
9783527607594 | details & prices | 378 pages | List price $175.00

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