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Soft Error Mechanisms, Modeling and Mitigation
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Bibliographic Detail
Publisher Springer Verlag
Publication date March 4, 2016
Binding Hardcover
Book category Adult Non-Fiction
ISBN-13 9783319306063
ISBN-10 3319306065
Dimensions 0.50 by 6.25 by 9.25 in.
Weight 0.80 lbs.
Original list price $99.00
Other format details sci/tech
Summaries and Reviews
Amazon.com description: Product Description: This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.  



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Hardcover
Book cover for 9783319306063
 
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from Springer Verlag (March 4, 2016)
9783319306063 | details & prices | 6.25 × 9.25 × 0.50 in. | 0.80 lbs | List price $99.00
About: This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects.

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