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Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices
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Bibliographic Detail
Publisher
John Wiley & Sons Inc
Publication date
September 15, 2014
Pages
365
Binding
Hardcover
Book category
Adult Non-Fiction
ISBN-13
9781118480489
ISBN-10
1118480481
Dimensions
1 by 5 by 9 in.
Weight
1.45 lbs.
Original list price
$134.00
Other format details
sci/tech
Summaries and Reviews
Amazon.com description: Product Description: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) - Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions - Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
Editions
Hardcover
The price comparison is for this edition
from John Wiley & Sons Inc (September 15, 2014)
9781118480489 | details & prices | 365 pages | 5.00 × 9.00 × 1.00 in. | 1.45 lbs | List price $134.00
About: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) - Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions - Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
About: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) - Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions - Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
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