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Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, Sspr & Spr 2010, Cesme, Izmir, Turkey, August 18-20, 2010, Proceedings
By Richard C. Wilson (editor), Edwin R. Hancock (editor), Terry Windeatt (editor), Ilkay Ulusoy (editor) and Francisco Escolano (editor)
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Bibliographic Detail
Publisher Springer-Verlag New York Inc
Publication date October 14, 2010
Binding Paperback
Edition 1
Book category Adult Non-Fiction
ISBN-13 9783642149795
ISBN-10 3642149790
Original list price $179.00
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Paperback
Book cover for 9783642149795
 
The price comparison is for this edition
With Terry Windeatt (other contributor), Francisco Escolano (other contributor), Richard C. Wilson (other contributor), Ilkay Ulusoy (other contributor) | 1 edition from Springer-Verlag New York Inc (October 14, 2010)
9783642149795 | details & prices | List price $179.00

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